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| Academic Year | 2016 |
|---|---|
| Journal Ranking | Others |
| Title of paper | Study of 600 V-Class Superjunction Metal–Oxide–Semiconductor Field-Effect Transistors with Termination of Trench Structure and SIPOS |
| Journal | International Journal of Electrical and Electronics Engineering Research |
| Date of Publication | 2016-11-01 |
| Issue | 6 |
| 起迄頁 | 13 |
| 起迄頁 | 21 |
| 總頁數 | 9 |
| Chinese name | Jyh-Ling Lin |
| English name | Jyh-Ling Lin |
| Authors | Fang-Wei Chang, Jyh-Ling Lin, Young-Huang Chou |
| Number of authors | 3 |
| 作者型態 | Corresponding Author |
| ISSN(ISBN) | 2250-155X |
| Language | 英文 |
| 所屬計畫案 | NSC 101-2622-E-211-004-CC3 |
