:::
Academic Year | 2016 |
---|---|
Journal Ranking | Others |
Title of paper | Study of 600 V-Class Superjunction Metal–Oxide–Semiconductor Field-Effect Transistors with Termination of Trench Structure and SIPOS |
Journal | International Journal of Electrical and Electronics Engineering Research |
Date of Publication | 2016-11-01 |
Issue | 6 |
起迄頁 | 13 |
起迄頁 | 21 |
總頁數 | 9 |
Chinese name | Jyh-Ling Lin |
English name | Jyh-Ling Lin |
Authors | Fang-Wei Chang, Jyh-Ling Lin, Young-Huang Chou |
Number of authors | 3 |
作者型態 | Corresponding Author |
ISSN(ISBN) | 2250-155X |
Language | 英文 |
所屬計畫案 | NSC 101-2622-E-211-004-CC3 |