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| Academic Year | 2015 |
|---|---|
| Journal Ranking | SCI |
| Title of paper | Effects of low-temperature Si buffer thickness and SiGe oxidation on sensitivity of Si1-xGex nanowire |
| Journal | Japanese Journal of Applied Physics |
| Date of Publication | 2015-06-01 |
| Volume | 54 |
| 起迄頁 | 06FG12-1 |
| 起迄頁 | 06FG12-5 |
| 總頁數 | 5 |
| Chinese name | Huai-Yi Chen |
| English name | Huai-Yi Chen |
| Authors | Yi-Lung Lai, Tai-Yuan Chang, Kow-Ming Chang, Chu-Feng Chen, Chiung-Hui Lai, Yi-Ming Chen, Allen Jong-Woei Whang, Hui-Lung Lai, Huai-Yi Chen, and Shiu-Yu Wang |
| Number of authors | 10 |
| 作者型態 | Other |
| Language | 英文 |
