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Journal Papers
Academic Year2005
Journal RankingSCI
Title of paperCharacteristics of superjunction lateral-double-diffusion metal oxide semiconductor field effect transistor and degradation after electrical stress.
JournalJapanese Journal of Applied Physics
Date of Publication2006-04-07
Volume45
Issue4A
起迄頁2451
起迄頁2454
總頁數4
Chinese nameJyh-Ling Lin
English nameJyh-Ling Lin
AuthorsJyh-Ling LIN,Ming-Jang LIN,Li-Jheng LIN
Number of authors3
作者型態First Author / Corresponding Author
Language英文
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